Journal of the European Optical Society - Rapid publications, Vol 8 (2013)

Thickness conditions for characterizing the periodic nanostructures with the retrieved electromagnetic parameters

D. Song, Z. Tang, L. Zhao, Z. Sui, S. Wen, D. Fan

Abstract


By analyzing the convergence of the retrieved effective electromagnetic parameters, we presented that one wavelength of the propagating wave in the nanostructure is the minimum thickness requirement for effectively characterizing a finite thickness nanostructure. This thickness condition has been separately validated in a photonic crystal with negative refraction and in a typical fishnet metamaterial which has been investigated theoretically and experimentally before.

© The Authors. All rights reserved. [DOI: 10.2971/jeos.2013.13028]

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