Journal of the European Optical Society - Rapid publications, Vol 8 (2013)
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning
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© The Authors. All rights reserved. [DOI: 10.2971/jeos.2013.13048]
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References
H. Gross, R. Model, M. Bar, M. Wurm, B. Bodermann, and A. Rathsfeld, â€Mathematical modelling of indirect measurements in scatterometry,†Measurement 39, 782–794 (2006).
H. Gross, J. Richter, A. Rathfeld, and M. Bar, â€Investigations on a robust profile model for the reconstruction of 2D periodic absorber lines in scatterometry,†J. Europ. Opt. Soc. Rap. Public. 5, 10053 (2010).
M. Wurm, F. Pilarski, and B. Bodermann, â€A new flexible scatterometer for critical dimension metrology,†Rev. Sci. Instrum. 81, 023701 (2010).
R. M. Silver, B. M. Barnes, A. Heckert, R. Attota, R. Dixson, and J. Jun, â€Angle resolved optical metrology,†Proc. SPIE 6922, 69221M (2008).
M. Wurm, S. Bonifer, B. Bodermann, and M. Gerhard, â€Comparison of far field characterisation of DOEs with a goniometric DUVscatterometer and a CCD-based system,†J. Europ. Opt. Soc. Rap. Public. 6, 11015s (2011).
O. El Gawhary, N. Kumar, S. F. Pereira, W. M. J. Coene, and H. P. Urbach, â€Performance analysis of coherent optical scatterometry,†Appl. Phys. B 105, 775–781 (2011).
N. Kumar, O. El Gawhary, S. Roy, V. G. Kutchoukov, S. F. Pereira, W. Coene, and H. P. Urbach, â€Coherent Fourier scatterometry: tool for improved sensitivity in semiconductor metrology,†Proc. SPIE 8324, 83240Q (2012).
S. Roy, O. El Gawhary, N. Kumar, S. F. Pereira, and H. P. Urbach, â€Scanning effects in coherent fourier scatterometry,†J. Europ. Opt. Soc. Rap. Public. 7, 12031 (2012).
P. Hariharan, Basics of interferometry, second edition (Academic Press, Amsterdam, 2007).
J. R. Fienup, â€Phase retrieval algorithms: A comparison,†Appl. Optics 21, 2758–2769 (1982).
H. M. L. Faulkner and J. M. Rodenburg, â€Movable aperture lensless transmission microscopy: A novel phase retrieval algorithm,†Phys. Rev. Lett. 93, 023903–1 (2004).
J. Miao, D. Sayre, and H. N. Chapman, â€Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,†J. Opt. Soc. Am. A 15, 1662–1669 (1998).
M. Born, and E. Wolf, Principles of Optics (Cambridge University Press, 1998).
D. W. Robinson, G. T. Reid, and P. D. Groot, â€Interferogram Analysis: Digital Fringe Pattern Measurement Techniques,†Phys. Today 47, 66 (1994).
R. R. Cordero, J. Molimard, A. MartÃnez, and F. Labbe, â€Uncertainty analysis of temporal phase-stepping algorithms for interferometry,†Opt. Commun. 275, 144–155 (2007).
V. S. Ignatowsky, â€Diffraction by lens of arbitrary aperture,†Trans. Opt. Inst. Petrograd 1 (4), 1–36 (1919).
B. Richards, and E. Wolf, â€Electromagnetic diffraction in optical systems II. Structure of the image field in an aplanatic system,†Proc. R. Soc. London Ser. A 253, 353–358 (1959).
L. Novotny, and B. Hecht, Principles of Nano-Optics (Cambridge University Press, 2006).